Abstract Electron diffraction emerges as a powerful technique for structural analysis of small crystals, especially those that are too small for single crystal X‐ray analysis or too complex for powder diffraction. Its growing popularity is driven by the strong electron‐matter interaction and the opportunity for single‐crystal data collection from nanosized crystals. However, this strong interaction often comes with the caveat of possible damage to the sample by the electron beam, a drawback that can affect the crystal structure and compromise data quality. This review delves into the details of the effects of beam damage on electron diffraction data, particularly focusing on the fading of Bragg reflections that are known to be the most sensitive damage indicator. By compiling the observations from quantitative measurements across the available reports, a treatise is provided on the effects of electron beam damage on electron diffraction data. Comparison of various mitigation strategies is also provided which sets guidelines for optimization of data collection strategies for efficient exposure of beam‐sensitive compounds. We hope that this review will provide valuable insights for the growing research community that resorts to electron diffraction for characterization of materials, sometimes as the only applicable method to determine the structure of very small crystals.
Yörük et al. (Fri,) studied this question.