Three-dimensional point cloud data acquired in industrial environments inherently exhibit quality limitations, including measurement noise, local geometric irregularities, and surface roughness. These issues are commonly observed in both structured-light scanning and SIFT-based photogrammetric reconstruction, highlighting the necessity of post-processing in metrology applications where dimensional accuracy and geometric reliability are critical. However, conventional global-parameter smoothing methods, such as Savitzky–Golay filtering, LOWESS, and bilateral filtering, apply uniform smoothing intensity across regions with varying curvature, resulting in an inherent trade-off between noise suppression and geometry preservation. In this study, we propose a learning-independent post-processing framework that adaptively modulates smoothing strength by integrating local curvature estimation with unsupervised anomaly modeling. The proposed approach combines normal-variance-based curvature approximation with k-nearest neighbor anomaly scoring, while CAD data are employed exclusively as an external reference for evaluation. Experimental results on industrial product datasets demonstrate that, for structured-light reconstructions, the proposed method reduces average error to a level comparable to local regression-based smoothing while simultaneously achieving the highest edge-preservation index among all evaluated methods, thereby attaining an optimal operating point between noise suppression and geometric integrity. Although the suppression of extreme deviations remains limited, the geometry-preservation metrics are improved without a significant increase in average error. In contrast, SIFT+COLMAP-based reconstructions exhibit performance comparable to that of the original data, a behavior attributable to low-frequency systematic reconstruction biases rather than high-frequency sensor noise, which fall outside the corrective capacity of purely geometry-driven local smoothing.
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Jae Kyung Lee
Korea Institute of Ocean Science and Technology
Soon Woo Kwon
Korea Institute of Ocean Science and Technology
Hae Gwang Park
Korea Institute of Ocean Science and Technology
Electronics
Kyungpook National University
Korea Institute of Ocean Science and Technology
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Lee et al. (Fri,) studied this question.
synapsesocial.com/papers/6a1bd1f65783ba022b6fd5d0 — DOI: https://doi.org/10.3390/electronics15112360