Machine vision based on artificial intelligence technology is being actively utilized to reduce defect rates in the photovoltaic module production process. This study aims to propose a machine vision approach using EfficientNet-B0 for defective photovoltaic module detection. In particular, the proposed approach is applied to the electroluminescence (EL) operation, which identifies microcracks in PV modules by using polarization current. The proposed approach extracts low-level structures and local brightness variations, such as busbars, fingers, and cell boundaries, from a single convolutional block. Furthermore, the mobile inverted bottleneck convolution (MBConv) block progressively transforms defect patterns—such as microcracks and dark spots—that appear at various shooting angles into high-level feature representations. The converted image is then processed using global average pooling (GAP), Dropout, and a final fully connected layer (Dense) to calculate the probability of a defective module. A sigmoid activation function is then used to determine whether a PV module is defective. Experiments show that the proposed Efficient-B0-based methodology can stably achieve defect detection accuracy comparable to AlexNet and GoogLeNet, despite its relatively small number of parameters and fast processing speed. Therefore, this study will contribute to increasing the efficiency of EL operation in industrial fields and improving the productivity of PV modules.
Shin et al. (Mon,) studied this question.