First Systematic Characterization of Floating Body Effects in GAA Nanosheet 3D DRAM Access Transistors

As DRAM scaling advances toward dense 3D architectures with Si-based select transistors, floating body effects (FBE) emerge as a critical reliability concern due to transient leakage and associated data retention risks. This work presents the methodology for the first experimental extraction of floating-body-induced bipolar current (FBC) in nanosheet GAA 3D DRAM access transistors, leveraging transistor arrays to access low IOFF regimes inaccessible to single-device measurements. Two device populations, defined by high and low quasi-static (QS) leakage, are studied using a measurement protocol that isolates the transient parasitic BJT contribution. FBC amplitude is analyzed as a function of pre-charge time and leakage, revealing strong dependence on body charging dynamics. Extrapolation toward target IOFF specifications, supported by TCAD, shows that floating body effects are expected to be effectively suppressed. These findings provide key reliability guidance for Si-based 3D DRAM architectures.