In this paper, an elastic-constant stress cohesive zone model is developed to analyze the interfacial behavior of a one-dimensional hexagonal piezoelectric quasicrystal film bonded to a couple-stress half-plane substrate, with surface effects taken into account. By imposing perfect bonding conditions and adopting a membrane assumption, the governing integral equation is constructed and numerically solved using the Chebyshev polynomial expansions. An iterative method is proposed to determine the cohesive zone size, and analytical expressions for the stress and strain distributions are derived. Systematic parametric studies are performed to elucidate the effects of characteristic length scales, substrate couple-stress length, film’s aspect ratio, and substrate-to-film stiffness ratio on the stress–strain fields and the evolution of the cohesive zone. The results provide foundational insights into interfacial mechanics and offer design guidelines for developing reliable, high-performance piezoelectric quasicrystal film devices.
Ye et al. (Tue,) studied this question.