Single-shot multi-plane coherent diffraction imaging with an anisotropic photon-sieve splitter

Coherent diffraction imaging (CDI) is a promising high-precision imaging technique with broad applications in fields such as biology and materials science. However, CDI typically requires multiple diffraction patterns at different recording planes for image reconstruction, which is traditionally achieved through mechanical or electronic scanning along the diffraction direction. This study proposes a single-shot multi-plane CDI method utilizing axially and radially separated focal spots from an anisotropic photon-sieve (PS) splitter, in which diffraction distances in the system depend solely on the focal lengths of the PS. This single-shot imaging method eliminates the need for scanning measurements, making it well-suited for dynamic detection and other applications demanding high real-time requirements. In the experiment, multiple test objects were used to validate feasibility of the imaging method. Owing to amplitude-only PS, the proposed method can be adapted to wavelengths ranging from x rays to extreme ultraviolet, providing the possibility for the single-shot measurement and imaging in the short-wavelength region.