February 11, 2015Open Access

350 Anos de Revistas Científicas

CMChris A. MackUniversity of North Carolina at Charlotte

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Abstract

O Journal of Micro/Nanopatterning, Materials, and Metrology (JM3) publica artigos revisados por pares sobre as tecnologias fundamentais que atendem às necessidades de padronização da indústria eletrônica.

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Chris A. Mack (Quarta-feira,) estudou esta questão.

synapsesocial.com/papers/69d9a5ffa1d151c65f684bbc https://doi.org/https://doi.org/10.1117/1.jmm.14.1.010101

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