Irradiation test for space-use semi-conductor devices using heavy-ion beams

Key Points

• The aim is to examine the effectiveness of heavy-ion beams in testing semiconductor devices intended for space applications.
• Facilitated accelerator tests for semiconductor devices under simulated space conditions.
• Focused on single event effects caused by high energy loss from heavy-ion beam interactions.
• Established testing environments accessible to companies unfamiliar with nuclear experiments.
• Identified single event effects as a key issue in semiconductor performance under heavy-ion exposure.
• Showcased improvements in testing protocols for space-use semiconductor devices.
• Highlighted trends in the development of radiation-resistant semiconductor technologies.