Abstract The exchange bias effect serves as one of the core working mechanisms in spintronic devices. Investigating the angular dependence of exchange bias (ADEB) is of significant importance for understanding the microscopic mechanism of the exchange bias effect. Currently, the characteristics of magnetization reversal in in-plane orthogonal anisotropy systems remain unclear, while hard magnetic (HM)/soft magnetic (SM) systems exhibit distinct advantages over conventional antiferromagnetic/ferromagnetic systems. In this context, it is of considerable value to conduct an in-depth exploration of the ADEB phenomenon in in-plane orthogonal anisotropy systems using HM/SM systems as the research subject. In this work, based on micromagnetic simulations, we systematically investigate the exchange bias effect and magnetization reversal behavior in the FeCo layer of L 1 0 FePt (HM)/FeCo (SM) bilayer thin-film structure with in-plane orthogonal anisotropy. The results demonstrate that the magnetization reversal mechanism in the FeCo layer can be effectively modulated by varying the FeCo layer thickness and the direction of the applied magnetic field. The angular dependence of the exchange bias field, coercivity, and magnetization reversal all exhibit rich and diverse behaviors with changes in the FeCo layer thickness. These findings provide additional insights for the application and modulation of the exchange bias effect in spintronic devices.
Zhou et al. (Thu,) studied this question.