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Starting from a description of the absolute phase problem in fringe processing and a discussion of existing solutions a general approach for robust absolute phase measurement in optical metrology is presented. Using this method the continous phase field can be reconstructed with high accuracy by a stepwise or so called hierarchical approach without any interaction necessary in conventional phase unwrapping if technical objects have to be investigated. The determination of the sequence of synthetic wavelengths is strongly oriented on the phase measuring accuracy and the known limits of the absolute phase. Keywords: optical metrology, shape measurement, displacement measurement, fringe processing, absolute phase measurement
Osten et al. (Wed,) studied this question.