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August 1, 1988Surface and Interface Analysis941 citationsOpen Access

Calculations of electron inelastic mean free paths for 31 materials

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STShigeo TanumaCPC. J. PowellDPDavid R. Penn

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Abstract

Abstract We present new calculations of electron inelastic mean free paths (IMFPs) for 200–2000 eV electrons in 27 elements (C, Mg, Al, Si, Ti, V, Cr, Fe, Ni, Cu, Y, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Os, Ir, Pt, Au and Bi) and four compounds (LiF, SiO 2 , ZnS and Al 2 O 3 ). These calculations are based on an algorithm due to Penn which makes use of experimental optical data (to represent the dependence of the inelastic scattering probability on energy loss) and the theoretical Lindhard dielectric function (to represent the dependence of the scattering probability on momentum transfer). Our calculated IMFPs were fitted to the Bethe equation for inelastic electron scattering in matter; the two parameters in the Bethe equation were then empirically related to several material constants. The resulting general IMFP formula is believed to be useful for predicting the IMFP dependence on electron energy for a given material and the material‐dependence for a given energy. The new formula also appears to be a reasonable but more approximate guide to electron attenuation lengths.

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Tanuma et al. (1988) studied this question.

synapsesocial.com/papers/6a70462131a3df82432888f1https://doi.org/10.1002/sia.740111107
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