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February 28, 2026The Journal of Physical Chemistry Letters0 citations

Ultrafast Band-Edge Carrier Dynamics in the Weyl Semiconductor Tellurium Microcrystal

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HJHyunmin JangJLJin Hyeok LeeGHGi Rim Han

Key Points

  • The aim is to investigate the intrinsic band-edge carrier dynamics in tellurium microcrystals at room temperature.
  • Utilized mid-infrared asynchronous interferometric transient absorption spectroscopy
  • Focused on band-edge resonances around 380 meV
  • Analyzed time-resolved data to identify fast and slow components of carrier dynamics
  • Developed a global spectro-temporal model for interpretation
  • Identified a fast component with a time constant of 1-2 ps
  • Found a long-lived component with a time constant of ∼50 ps
  • Attributed fast dynamics to phonon-assisted redistribution of valence holes
  • Attributed slow dynamics to band-edge electron-hole recombination

Abstract

Rod-shaped tellurium microcrystals are promising mid-infrared photonic materials and a prototypical chiral (Weyl) semiconductor, yet intrinsic band-edge relaxation at room temperature is often masked by hot-carrier and photothermal pathways under above-gap excitation. Here, we employ mid-infrared asynchronous and interferometric transient absorption (MIR AI-TA) spectroscopy with frequency-comb pulses centered near the band-edge (380 meV) to directly interrogate two band-edge resonances. The time- and frequency-resolved AI-TA data reveal a fast component characterized by a time constant of 1-2 ps and a long-lived component with a time constant of ∼50 ps, common to both resonances. A global spectro-temporal model assigns the fast component to phonon-assisted redistribution of valence holes coupled to recovery of pump-induced Peierls distortion, while the slow component corresponds to band-edge electron-hole recombination. These results demonstrate that MIR AI-TA can quantitatively disentangle coupled electronic and structural dynamics in narrow-bandgap semiconductors.

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Cite This Study

Jang et al. (2026) studied this question.

synapsesocial.com/papers/69a286b80a974eb0d3c01f00https://doi.org/10.1021/acs.jpclett.5c03942
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