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April 1, 1978Journal of Applied Crystallography3,848 citations

Scherrer after sixty years: A survey and some new results in the determination of crystallite size

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JLJ. I. LangfordAWA. J. C. Wilson

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Abstract

Existing knowledge about Scherrer constants is reviewed and a summary is given of the interpretation of the broadening arising from small crystallites. Early work involving the half-width as a measure of breadth has been completed and Scherrer constants of simple regular shapes have been determined for all low-angle reflections (h2 + k2 + l2 ≤ 100) for four measures of breadth. The systematic variation of Scherrer constant with hkl is discussed and a convenient representation in the form of contour maps is applied to simple shapes. The relation between the `apparent' crystallite size, as determined by X-ray methods, and the `true' size is considered for crystallites having the same shape. If they are of the same size, then the normal Scherrer constant applies, but if there is a distribution of sizes, a modified Scherrer constant must be used.

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Cite This Study

Langford et al. (1978) studied this question.

synapsesocial.com/papers/69d7283d3f906f6a06bef7b6https://doi.org/10.1107/s0021889878012844
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