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April 16, 20260 citationsOpen Access

Review On Smart Digital IC Testing System Using Microcontroller

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ASAtharv Santosh ShindeMPMahesh Mahadev PatilOSOmkar Shashikant Salunkhe

Key Points

  • To propose an automated system for testing integrated circuits, reducing manual labor and errors.
  • Utilized Arduino Mega 2560 microcontroller
  • Tested 74-series logic gates and other components
  • Employed a ZIF socket and 4x4 keypad for input
  • Provided feedback through an LCD and buzzer
  • Incorporated protective features like current-limiting resistors
  • Automated testing showed high accuracy in results
  • Provided pass/fail outputs based on predefined input patterns
  • Enhanced portability and upgradability for users
  • Cost-effective solution at ₹6040
  • Addressed limitations of previous Arduino-based systems

Abstract

Integrated Circuits (ICs) are the foundation of modern electronics; however, manual functional verification is often labour-intensive and prone to errors. This paper introduces a Smart Digital IC Testing System that utilizes an Arduino Mega 2560 microcontroller to automate the testing of 74-series logic gates (AND, OR, NOT, NAND, NOR, XOR), a 555 timer, and a 741 op-amp through a ZIF socket, a 4x4 keypad, and an LCD/buzzer for feedback. The system applies predefined input patterns and compares the outputs against embedded reference values, providing pass/fail results. It incorporates protective features such as current-limiting resistors and voltage clamping. Priced at ₹6040, this system offers high accuracy, portability, and upgradability, making it ideal for laboratories and repair shops. It effectively addresses the shortcomings of previous Arduino/ by integrating mixed-signal verification within an affordable platform.

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Cite This Study

Shinde et al. (2026) studied this question.

synapsesocial.com/papers/69e07d3c2f7e8953b7cbe40ahttps://doi.org/10.5281/zenodo.19564595
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