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November 8, 2018IUCrJ1,082 citationsOpen Access

A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

JZJasenko ZivanovTNTakanori NakaneSSSjors H. W. Scheres

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Abstract

-3, where it replaces the existing particle-polishing method, as it outperforms the latter in all tests conducted.

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Zivanov et al. (2018) studied this question.

synapsesocial.com/papers/69ff9be8581c6e761e777df7https://doi.org/10.1107/s205225251801463x
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