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Photoemission measurements have been made on clean silicon surfaces having (111) 7 7, (111) 2 1, and (100) 2 1 low-energy electron diffraction patterns. An approximate separation of the data into surface and bulk components yields a bulk distribution which is in better agreement with the theoretical density of states than previous results. The surface distribution for the (111) 7 7 surface contains five distinct features.
Rowe et al. (1974) studied this question.
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