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May 1, 2011Journal of Applied Physics33 citationsOpen Access

Precision, all-optical measurement of external quantum efficiency in semiconductors

CWChengao WangCLChia-Yeh LiMHMichael P. Hasselbeck

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Abstract

External quantum efficiency of semiconductor photonic devices is directly measured by wavelength-dependent laser-induced temperature change (scanning laser calorimetry) with very high accuracy. Maximum efficiency is attained at an optimum photo-excitation level that can be determined with an independent measurement of power-dependent temperature or power-dependent photoluminescence. Time-resolved photoluminescence lifetime and power-dependent photoluminescence measurements are used to evaluate unprocessed heterostructures for critical performance parameters. The crucial importance of parasitic background absorption is discussed.

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Cite This Study

Wang et al. (2011) studied this question.

synapsesocial.com/papers/6a0e36b7af86e8b097c83f2fhttps://doi.org/10.1063/1.3580259
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