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September 27, 2004Applied Physics Letters267 citationsOpen Access

Epitaxial BiFeO3 thin films on Si

JWJunling WangHZHaimei ZhengZMZhijun Ma

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Abstract

BiFeO 3 was studied as an alternative environmentally clean ferro/piezoelectric material. 200-nm-thick BiFeO3 films were grown on Si substrates with SrTiO3 as a template layer and SrRuO3 as bottom electrode. X-ray and transmission electron microscopy studies confirmed the epitaxial growth of the films. The spontaneous polarization of the films was ∼45μC∕cm2. Retention measurement up to several days showed no decay of polarization. A piezoelectric coefficient (d33) of ∼60pm∕V was observed, which is promising for applications in micro-electro-mechanical systems and actuators.

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Cite This Study

Wang et al. (2004) studied this question.

synapsesocial.com/papers/6a0ebc3f06ecbe833447c013https://doi.org/10.1063/1.1799234
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