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May 31, 2026Optics0 citationsOpen Access

Benchmarking Focus Metrics for Microparticle Localization in Digital Holography

Benchmarking Focus Metrics for Microparticle Localization in In-Line Digital Holography

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Authors

BSBrandon R. Sulvarán-SalmorenoDMD. Moreno-HernándezDTD. Torres-Armenta

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Overview

Experimental and simulated evaluation of localization metrics reveals robustness in microparticle imaging.

Key Points

  • The aim is to benchmark focus metrics for accurate axial localization of microparticles in digital holography.
  • Recorded experimental holograms of microparticles using a compact in-line digital holography system.
  • Generated simulated holograms of a 10 µm particle and performed numerical reconstruction using Fresnel convolution and FFT-based propagation.
  • Evaluated focus metrics for robustness under noise and consistency across different particle sizes.
  • Maximum intensity and kurtosis metrics consistently provided reliable axial localization across all cases.
  • Complex amplitude metric showed higher sensitivity to noise with larger fluctuations in axial response.
  • Simple intensity-based metrics can achieve accurate localization in moderate signal-to-noise conditions.

Cite This Study

Sulvarán-Salmoreno et al. (2026) studied this question.

synapsesocial.com/papers/6a1bd0fa5783ba022b6fca7ahttps://doi.org/10.3390/opt7030038
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