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February 25, 1991Applied Physics Letters76 citations

In situ extended x-ray absorption fine structure spectroscopy of thin-film nickel hydroxide electrodes

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TCT. W. CapehartDCD. A. CORRIGANRCRobert S. Conell

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Abstract

A convenient in situ electrochemical cell has been developed which permits x-ray absorption measurements on thin-film electrodes under electrochemical polarization. Extended x-ray absorption fine structure spectra from highly disordered α-Ni(OH)2 films, before and after polarization, provided quantitative results on the lattice contraction accompanying oxidation. Upon oxidation of α-Ni(OH)2, the Ni-O distance contracted from 2.05 to 1.86 Å, and the Ni-Ni distance contracted from 3.09 to 2.82 Å. The observed 10% contraction in the brucite plane is consistent with the 3.67 nickel valence in a K(NiO2)3 phase. The present technique extends x-ray absorption spectroscopy to the study of a variety of unstable materials not amenable to ex situ techniques.

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Capehart et al. (1991) studied this question.

synapsesocial.com/papers/6a1ef9494ae5dc9c58b2fccfhttps://doi.org/10.1063/1.104489
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