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June 3, 20260 citationsOpen Access

Preprint of "Experimental Evaluation of Detection Speed in Optical Based Internal Arc Fault Control Devices Using Flashlight-Simulated Arc Illuminance"

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RBRafal BurzyńskiSBSebastian Berhausen

Key Points

  • This research aims to evaluate how different configurations of optical Internal Arc Fault Control Devices affect detection speed.
  • Measured detection speed of IACDs using a flashlight simulating electrical arc illuminance.
  • Compared detection speeds among commercially available IACDs through box plots and Individual Moving Range charts.
  • Evaluated the impact of flashlight energy on the reaction times of optical sensors.
  • Detection speed varied significantly with different IACD configurations.
  • Measurements demonstrated dependency of reaction times on flashlight energy, indicating optimal sensor placement.
  • Box plots illustrated the influence of various test conditions on IACD operation speed.

Abstract

Optical based Internal Arc Fault Control Devices (IACDs) play a crucial role in the detection speed of arc faults in low-voltage switchgear assemblies. They can utilize different types of sensors (point and line) and contain different types of output (semiconductor and relay). The configuration of an IACD will influence the total detection time of such a system. This article presents a comparison of the detection speed of commercially available optical based IACDs. It describes the method used to measure the speed of operation of IACDs using a flashlight that simulates the illuminance of an electrical arc. The results are presented and compared using box plots and Individual Moving Range (I-MR) charts. Box plots offer at glance comparison of influence of different test conditions on the speed of operation, and I-MR charts help to evaluate the measurement method. The measurements also indicate a dependence of the reaction times of the tested IACD on the energy of the flashlight. This information is useful in designing the proper placement of optical sensors and allows the selection of a system configuration that will ensure the fastest reaction time under given test conditions applicable to low-voltage switchgear assemblies.

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Cite This Study

Burzyński et al. (2026) studied this question.

synapsesocial.com/papers/6a1fc58bdee9eb8c0dce6fc3https://doi.org/10.5281/zenodo.20478900
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