PulseExploreJournal ClubDebatesTrendingResearchersJournals
Instagram
HomeExploreJournal ClubTrending
Synapse
⌘+K
Synapse
June 13, 2026Electronics0 citationsOpen Access

Study on the Fabrication and Performance of BiSbO4-Doped ZnO Varistor Ceramics

View Full Paper
JHJunyi HuangYTYuansheng TuHHHai Huang

Key Points

  • The study aims to explore the effects of BiSbO4 doping on the microstructure and electrical characteristics of ZnO varistor ceramics.
  • Synthesis of BiSbO4 with a Bi2O3 to Sb2O3 molar ratio of 0.6:1.
  • Calcination of BiSbO4 at 700 °C.
  • Investigation of varying BiSbO4 content on the microstructure and electrical properties of ZnO varistors.
  • At 2% BiSbO4, the voltage gradient reached 346 V·mm−1.
  • Leakage current was measured at 0.14 μA·cm−2 with a nonlinear coefficient of 32.
  • Surge stability maintained at 93.5% after exposure to a 100 kA surge.

Abstract

By synthesizing BiSbO4 material with a molar ratio of Bi2O3 to Sb2O3 of 0.6:1 and calcining it at 700 °C, a relatively pure compound was obtained. Additionally, the effects of varying BiSbO4 content on the microstructure and electrical properties of ZnO varistor ceramics were investigated. Results indicate that as BiSbO4 content increased from 0% to 3%, the voltage gradient of the varistor rose with increasing BiSbO4 content while leakage current gradually decreased. The nonlinear coefficient continued to rise, while the residual voltage ratio first decreased then increased. At a BiSbO4 content of 2%, outstanding electrical properties were achieved: voltage gradient (E1mA) = 346 V·mm−1, leakage current JL = 0.14 μA·cm−2, nonlinear coefficient α = 32, and residual voltage ratio K = 1.73. Furthermore, after undergoing a 100 kA surge, the U1mA value remained at 93.5% of its initial value, demonstrating outstanding surge stability. This provides a new approach for fabricating high-gradient, high-stability varistors.

Ask AI
Helpful
Bookmark
Share
View Full Paper

Cite This Study

Huang et al. (2026) studied this question.

synapsesocial.com/papers/6a2cf604faef96ed7f057df3https://doi.org/10.3390/electronics15122575
Ask AI
Helpful
Bookmark
Share
View Full Paper