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We introduce a simple modification to the Z-scan technique that results in a sensitivity enhancement that permits measurement of nonlinearly induced wave-front distortion of =lambda/10(4). This sensitivity was achieved with 10-Hz repetition-rate pulsed laser sources. Sensitivity to nonlinear absorption is also enhanced by a factor of =3. This method permits characterization of nonlinear thin films without the need for waveguiding.
Xia et al. (1994) studied this question.
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