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July 1, 1966IEEE Transactions on Electron Devices8 citations

Influence of non-equilibrium carriers on the surface breakdown of diodes and MOS-structures

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WSW. SchroenRWR.D. WoodruffDFDavid P. Farrington

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Abstract

The effect of a reduction of breakdown voltage V₁by external illumination of an oxide protected planar n+p diode or by non-equilibrium carriers drifting in a surface channel has been investigated. The appearance of a localized area where the external light spot causes maximum V₁is described. The influence of light wavelength and ambient has been studied. A model is presented to explain the facts that a small current of non-equilibrium carriers controls an avalanche current which is several orders of magnitude larger, and that no lock-on mechanism has been observed. The model involves the field enhancement by slowly moving carriers in the space charge region at a narrow distance from the Si-SiO2interface. The influence of surface potentials on these carriers is emphasized.

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Schroen et al. (1966) studied this question.

synapsesocial.com/papers/6a6fc17878a11c550e0984fdhttps://doi.org/10.1109/t-ed.1966.15737
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