PulseExploreJournal ClubDebatesTrendingResearchersJournals
Instagram
HomeExploreJournal ClubTrending
Synapse
⌘+K
Synapse
February 1, 1994Langmuir132 citations

Atomic Force Microscopy: Imaging with Electrical Double Layer Interactions

View Full Paper
TSTim J. SendenCDCalum J. DrummondPKPatrick Kékicheff

Key Points

Key points are not available for this paper at this time.

Abstract

International audience

Ask AI
Helpful
Bookmark
Share
View Full Paper

Cite This Study

Senden et al. (1994) studied this question.

synapsesocial.com/papers/6a6fd78d5d37378ac1dce49dhttps://doi.org/10.1021/la00014a004
Ask AI
Helpful
Bookmark
Share
View Full Paper