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May 1, 1982Review of Scientific Instruments89 citations

Microoptic double beam system for reflectance and absorption measurements at high pressure

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KSK. SyassenRSRóbert Sonnenschein

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Abstract

A microoptical double beam system for reflectance and absorption measurements from small samples (less than 100 μm size) in the spectral range of 0.5–5 eV is described. In conjunction with a diamond anvil high-pressure cell the system is particularly useful for optical reflectivity measurements at pressures up to 400 kbar. Examples are furnished illustrating the use of the system in high-pressure investigations of the stage two graphite intercalation compound C24SbCl5 and of solid oxygen. We briefly comment on Raman spectroscopy at high pressure.

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Syassen et al. (1982) studied this question.

synapsesocial.com/papers/6a76c5192e130d02afec2ec3https://doi.org/10.1063/1.1137035
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