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July 8, 1982Electronics Letters41 citations

Low-threshold GRIN-SCH GaAs/GaAlAs laser structure grown by OM VPE

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SHS. D. HerseeMBM. BaldyPAP. Assenat

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Abstract

The letter describes the characteristics of a graded-refractive-index (GRIN) separate-confinement-heterostructure (SCH) laser grown by organometallic vapour-phase-epitaxy (OM VPE). The structure has an average threshold current density of 410 A cm−2 for a chip size (190 μm × 392 μm) which decreases to 260 A cm−2 for a cavity length of 1352 μm. The structure has a T0 of between 154 and 171 K and an internal quantum efficiency of 90% ± 10%.

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Hersee et al. (1982) studied this question.

synapsesocial.com/papers/6a817b226034bcd5e86915eehttps://doi.org/10.1049/el:19820423
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