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July 1, 1992Journal of Vacuum Science & Technology A Vacuum Surfaces and Films82 citations

Tip–sample forces in scanning probe microscopy in air and vacuum

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DGD. A. GriggPRP. E. RussellJGJ. E. Griffith

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Abstract

Forces between a probe and sample have been measured in air and vacuum using a rocking beam force balance sensor capable of simultaneously obtaining both force and tunneling topographs. Force versus distance curve measurements demonstrate the effects of capillary forces in air but not in vacuum. Simultaneous scanning tunneling microscope (STM) imaging and force measurement in air show spatial force variations consistent with repulsive force tunneling. Our results support observations of large repulsive forces in STM occurring from surface contaminants. These results show how forces can affect image formation in both STM and scanning force microscopy.

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Cite This Study

Grigg et al. (1992) studied this question.

synapsesocial.com/papers/6a886e338c7e900eb714d2e5https://doi.org/10.1116/1.577709
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