An imaging device to measure the reflective and transmittive part of the BSSRDF

The bidirectional scattering-surface reflectance distribution function (BSSRDF) is a fundamental scattering quantity that characterizes the appearance of translucent materials. The few existing BSSRDF measurement facilities that ensure traceable results have shown the high complexity of such measurement, while only accounting for light scattered in the reflection hemisphere. We have developed an imaging device for measuring both the reflective and the transmissive part of the spectral BSSRDF. The complete analysis of the uncertainties associated with the facility allows relative measurement errors of around 10%. The measurements performed on two translucent samples and primary comparisons with metrological measurements are provided and discussed.