Reconstruction of the phonon mean free path spectrum in silicon thin film via transducer-free quasi-ballistic measurements

Key Points

• The phonon mean free path spectrum in silicon thin films is successfully reconstructed, showing significant variations.
• Key evidence includes measurements that demonstrate phonon behavior under quasi-ballistic conditions.
• Approach involves transducer-free quasi-ballistic measurements to analyze phononic properties effectively.
• Findings underscore the importance of phonon transport in enhancing thermal management in silicon-based devices.