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ADAMNet: Improving imbalanced defect classification with Anomaly-Driven Attention Maps | Synapse
March 3, 2026
ADAMNet: Improving imbalanced defect classification with Anomaly-Driven Attention Maps
JL
Jie Liang
Peking University
YG
Y.S. Gan
SL
Sze‐Teng Liong
National United University
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Key Points
Improved defect classification observed with anomaly-driven attention maps, enhancing model effectiveness.
Accuracy increased by up to 20% compared to traditional methods, indicating significant performance gains.
Assessment using advanced machine learning algorithms focused on imbalanced defect data for optimization.
Highlights the need for innovative approaches in defect detection to ensure reliable outcomes in real-world applications.
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Cite This Study
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Liang et al. (Thu,) studied this question.
synapsesocial.com/papers/69a767dcbadf0bb9e87e2ab0
https://doi.org/https://doi.org/10.1016/j.measurement.2026.120537