Development and Characterization of Poly(Vinylidene Fluoride)/Sn-Doped CaCu3Ti4O12 Thin Film with Enhanced Dielectric and Mechanical Properties
Key Points
Enhanced dielectric properties observed in poly(vinylidene fluoride) thin films with sn-doped CaCu3Ti4O12 additives.
With a notable improvement of 25% in dielectric constant over standard PVDF, these materials showcase significant potential for electronic applications.
Characterization via X-ray diffraction and scanning electron microscopy reveals the structural integrity of the thin films.
Results indicate strong mechanical properties, underscoring the material's suitability for flexible electronic devices.
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Development and Characterization of Poly(Vinylidene Fluoride)/Sn-Doped CaCu3Ti4O12 Thin Film with Enhanced Dielectric and Mechanical Properties | Synapse