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We derive the universal geometrical exponents of contour loops on equilibrium rough surfaces, using analytical scaling arguments (confirmed numerically): the fractal dimension D₅, the distribution of contour lengths, and the probability that two points are connected by a contour. This is sufficient to calculate exact critical exponents in certain nontrivial two-dimensional spin models that can be mapped to interface models. The novel scaling relation between D₅ and the roughness exponent that we find can be used to analyze scanning tunneling microscopy images of rough metal surfaces.
Kondev et al. (Mon,) studied this question.
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