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Nowadays, demand for computing power grows faster than ever. This results in more integrated circuits are being dedicated to memories. The efficient testing of such SRAM memories is a difficult task. An integrated Memory Built-In Self-Test (MBIST) module provides an effective testing capability with reasonable area cost. This paper describes the design of a configurable MBIST processor for embedded single-port and dual-port memories testing. Embedded memory fault models were summarized. The developed test environment with memory model and fault injection capability was used to verify the effectiveness of the implemented algorithms.
Wojciechowski et al. (Sat,) studied this question.