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Structural information about the degree of chain alignment in thin polymer films can be obtained by ellipsometry. A combination of reflection and transmission ellipsometry has been employed to determine the ordinary and extraordinary optical constants in conjugated polymer films in both the absorbing and transparent regions. Optical constants obtained by this technique will allow accurate modeling of the optical structure of polymer light-emitting diodes (LEDs) and photodiodes.
Ramsdale et al. (Tue,) studied this question.
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