In the Standard Model, the electron mass is encoded in a Yukawa coupling and is not predicted from first principles. In Meta-Connective Physics (MCP), the microscopic substrate is modeled as a network of Relational Tension Quanta (RTQ). The electron is modeled as an acyclic RTQ influence spine carrying a closed internal massive-Dirac holonomy, embedded in a three-dimensional coherent causal carrier. This paper reframes the electron-mass problem as a metrology problem for the conformal causal depth of the Universe. Once a conformal causal depth T and a structural angle are supplied, the RTQ/MCP electron readout is fixed: \ mₑ^ predc² (T, ₒₓₑₔ₂ₓ) = ₄, ₂₄ c88\, P ₒₓₑₔ₂ₓ (tPT) ^1/3. question is therefore not whether one can tune a lepton mass formula, but which independently auditable route supplies the physically relevant conformal causal depth T ₂₎₍₅^ lock. Three routes are studied. Route I is a Planck-2024/PR4 NPIPE cosmological-parameter route: (H₀, _, c h², h²) fixes ₑ₄^ lock, T ₑ₄^ lock, and reconstructs the historical/conformal value ₒₓₑₔ₂ₓ=0. 3589887297, giving mₑ c²=0. 511058662~MeV, a relative deviation 1. 1710^-4 from CODATA. Route II is the internal MCP structural-susceptibility route: the zero-mode coordinate X supplies a sharper conformal depth T ₂₎₍₅^ lock14. 19~Gyr, giving mₑ c²=0. 511044~MeV, a central-value deviation 8. 7610^-5. Route III is an external conformal-gravity concordance route: Faria's massive conformal-gravity fit to Pantheon SNIa reports t₀=14. 190. 03~Gyr, which is read here not as a proof of MCP but as an external conformal-depth scale compatible with the same RTQ/MCP electron readout. The result is not a Koide-type charged-lepton relation, nor a fitted Yukawa texture. It is a three-route conditional cross-sector audit: Planck-2024/PR4 NPIPE cosmological parameters, MCP structural susceptibility, and an independent conformal-gravity cosmology all feed the same causal-depth readout of the electron. The agreement is a central-value structural closure, not yet a full uncertainty-propagated metrological prediction.
Michael VAILLANT (Tue,) studied this question.