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Views Icon Views Article contents Figures Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry. Appl. Phys. Lett. 10 March 2014; 104 (10): 103114. https://doi.org/10.1063/1.4868108 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search
Yim et al. (Mon,) studied this question.
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