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A set of reference intensities, ki, are required for the quantitative interpretation of X-ray diffraction patterns of mixtures. Each ki was heretofore determined individually from binary mixtures of a one-to-one weight ratio. A procedure for the determination of all ki's of interest simultaneously is presented. The X-ray diffraction patterns of multicomponent mixtures usually contain overlapping peaks. This overlapping problem can be avoided by choosing an arbitrary reference material already present in the mixture and/or using the strongest resolved reflections directly. These concepts are substantiated by ten examples. The maximum standard deviation of the matrix-flushing method has been estimated to be 8% relative.
Frank H. Chung (Sat,) studied this question.