In situ Brewster angle microscopy and surface pressure studies on the interfacial growth of mesostructured silica thin films

Key Points

• This research aims to observe the growth process of mesostructured silica thin films at the air/water interface.
• Utilized Brewster angle microscopy for real-time imaging of film growth.
• Conducted surface pressure measurements to monitor interfacial dynamics.
• Focused on the nucleation phase and surface coverage during the growth period.
• Nucleation of the silica film was observed instantaneously at the air/water interface.
• Rapid growth of the thin film to full surface coverage was noted by the end of the induction period.