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The charge-coupled device has shown unprecedented performance as a photon detector in the areas of spectral response, charge transfer, and readout noise. Recent experience indicates, however, that the full potential for the CCD's charge-collection efficiency (CCE) lies well beyond that realized in currently available devices. In this paper we present a definition of CCE performance and introduce a standard test tool (the photon-transfer technique) for measuring and optimizing this important CCD parameter. We compare CCE characteristics for different types of CCDs, discuss the primary limitations in achieving high CCE performance, and outline the prospects for future improvement.
Janesick et al. (Thu,) studied this question.