Key points are not available for this paper at this time.
Apparatus and methods are described for measuring in the infrared the normal spectral emissivity of m etals a nd coatings or oxides which tightly adhere to metals. Examples of t he use of this a pparatus are givon in measurements of the emissivity of pl atinum a nd of ox idized Inconel within t he spectral region of 1.5 to 15 microns. Meas ured values were reproduced to better than 5 percent.
Maki et al. (1960) studied this question.