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As solar cells from direct semiconductors improve, i.e. become more radiative, luminescent coupling becomes more and more relevant. This has a strong impact on artifacts in EQE measurements of multi-junction solar cells, which e.g. is a challenge, when characterizing III-V//Si multi-junction solar cells. By measuring the response of these cells under varying illumination conditions, this effect can be understood and EQE measurements can be corrected.
Höhn et al. (Wed,) studied this question.