As solar cells from direct semiconductors improve, i.e. become more radiative, luminescent coupling becomes more and more relevant. This has a strong impact on artifacts in EQE measurements of multi-junction solar cells, which e.g. is a challenge, when characterizing III-V//Si multi-junction solar cells. By measuring the response of these cells under varying illumination conditions, this effect can be understood and EQE measurements can be corrected.
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Höhn et al. (2024) studied this question.
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