Temperature and interface trap-induced variations in RF analog and linearity performance of a drain-scaled Si/GaAs uniform tunnel FET dengue nano-biosensor

Puntos clave

• RF analog performance decreases with increasing temperature and interface trap density, affecting the biosensor's reliability.
• Key metrics show that variations in performance are critically influenced by both temperature and interface traps in the device.
• Assessment using tunnel field-effect transistors reveals performance challenges linked to environmental changes impacting biosensors.
• Highlighting the importance of managing temperature and interface traps opens pathways for enhancing biosensor technology for disease detection.