Temperature and interface trap-induced variations in RF analog and linearity performance of a drain-scaled Si/GaAs uniform tunnel FET dengue nano-biosensor

T. Ranjith Kumar; G. Lakshmi Priya

doi:10.1007/s00542-025-05976-0

January 28, 2026Microsystem Technologies

Temperature and interface trap-induced variations in RF analog and linearity performance of a drain-scaled Si/GaAs uniform tunnel FET dengue nano-biosensor

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Key Points

RF analog performance decreases with increasing temperature and interface trap density, affecting the biosensor's reliability.
Key metrics show that variations in performance are critically influenced by both temperature and interface traps in the device.
Assessment using tunnel field-effect transistors reveals performance challenges linked to environmental changes impacting biosensors.
Highlighting the importance of managing temperature and interface traps opens pathways for enhancing biosensor technology for disease detection.

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Implication

Observational analysis investigates RF analog performance in a dengue nano-biosensor, suggesting that interface traps and temperature impact functionality.

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Kumar et al. (2026) studied this question.

synapsesocial.com/papers/69a75cd7c6e9836116a260a3 https://doi.org/10.1007/s00542-025-05976-0

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Temperature and interface trap-induced variations in RF analog and linearity performance of a drain-scaled Si/GaAs uniform tunnel FET dengue nano-biosensor

Key Points

No abstract yet

Implication

Discussion

Cite This Study

Temperature and interface trap-induced variations in RF analog and linearity performance of a drain-scaled Si/GaAs uniform tunnel FET dengue nano-biosensor

Key Points

No abstract yet

Implication

Discussion

Cite This Study

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