Analytical expressions for the damage-limited resolution (DLR) are developed and applied to X-ray and electron imaging of beam-sensitive specimens, allowing for variation of the characteristic radiation dose with spatial resolution. The dependence of DLR on specimen thickness is illustrated for the common modes of X-ray and transmission electron-microscope imaging. Similarities and differences between the radiolysis damage caused by electrons and X-rays are discussed. The meaning of a `Bragg boost' in diffracted intensity is discussed.
Egerton et al. (Tue,) studied this question.
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