Pulse Explorar nav.journalClub Debates Tendencias Investigadores

Join discussions, follow papers, and never miss your next session.

Download on theApp Store

Inicio Explorar nav.journalClub Tendencias

⌘+K

An IEEE 1149.1 based test access architecture for ICs with embedded cores | Synapse

November 23, 2002

Ver artículo completo

An IEEE 1149.1 based test access architecture for ICs with embedded cores

LWL. WhetselTexas Instruments (United States)

Puntos clave

Los puntos clave no están disponibles para este artículo en este momento.

Resumen

This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores.

Preguntar a la IA

Me gusta

Guardar

Compartir

Ver artículo completo

Cite This Study

L. Whetsel (Sat,) studied this question.

synapsesocial.com/papers/6a204fbce9ca693ff1e72171 https://doi.org/https://doi.org/10.1109/test.1997.639596

Preguntar a la IA

Me gusta

Guardar

Compartir

Ver artículo completo