Development of Novel, Radiation-Hard, Ultra-Compact Active Beamstops with Integrated 4-Quadrant X-ray Sensors for Scattering Experiments on High-Brilliance Undulator Beamlines

SenSiC GmbH, a spin-off from the Swiss Light Source (SLS), has developed a new class of beamstopper sensors, termed Beamstopper Integrated Sensors (BIS)1,2, based on Silicon Carbide (SiC) semiconductor technology. Using custom processing and assembly methods, BIS devices achieve ultra-compact footprints below 1 mm and are designed for both real-time intensity monitoring and four-quadrant beam position sensing. The choice of SiC enables extreme radiation hardness and intrinsic insensitivity to visible light, enhancing sensitivity and signal fidelity by suppressing stray light contributions. BIS sensors have been successfully validated in operational environments: intensity-monitoring devices were tested at the SLS, while position-sensitive variants were deployed at MaxIV. These results demonstrate the robustness and precision of the BIS technology, offering a compact, radiation-resistant solution for integrated beam diagnostics in high-brilliance synchrotron beamlines.