Voltage security assessment is increasingly challenged by stochastic demand growth and localized stress patterns that are not well represented by deterministic, single-snapshot analyses. This paper proposes a fully steady-state probabilistic stress-testing framework based on Monte Carlo simulation and Newton–Raphson AC power flow, jointly evaluating the minimum bus voltage magnitude Vmin (voltage-floor adequacy) and the scenario maximum Fast Voltage Stability Index FVSImax (worst-case line stress). Stress is injected selectively on screened weak buses by sampling a random stress footprint and intensity across three progressive levels (L1–L3), while preserving the local power factor. The approach is demonstrated on IEEE 14-, 30-, and 118-bus benchmark systems using N=2000 realizations per level, with 100% convergence across all cases. Across all systems, results show a consistent, monotone degradation of the voltage floor and a systematic increase in violation risk as stress intensifies. For the IEEE 14 system, the voltage-risk profile escalates rapidly, with P(Vmin92% of cases), and complete dominance collapse in IEEE 118 (one corridor governing 100% of FVSImax events). These results demonstrate that probabilistic stress-testing can simultaneously quantify voltage-risk escalation and expose hidden structural bottlenecks that remain invisible under deterministic screening, providing a scalable diagnostic tool for planning-stage monitoring and reinforcement prioritization.
Jaramillo et al. (Tue,) studied this question.