Annealing-induced Oxide–Matrix interactions and their impact on electrical properties of CoCrFeMnNi high-entropy alloy thin films

Key Points

• Electrical properties are influenced by oxidation processes that occur during annealing, affecting conductivity.
• The study highlights significant changes in electrical behavior under varying annealing temperatures within high-entropy alloys.
• Assessment of thin film structures reveals that oxide-matrix interactions play a critical role in overall material performance.
• Findings may enable improved designs for electronic components with enhanced durability and efficiency.